The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 2015
Filed:
Mar. 14, 2013
Applicant:
Emc Corporation, Hopkinton, MA (US);
Inventors:
Hung Hing Anthony Pang, San Jose, CA (US);
Fabiano Botelho, Sunnyvale, CA (US);
Dhanabal Ekambaram, Milpitas, CA (US);
Nitin Garg, Sunnyvale, CA (US);
Assignee:
EMC Corporation, Hopkinton, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30135 (2013.01);
Abstract
Selective repair of fragmentation in a synthetic backup, based at least in part on a dynamically-determined repair criteria, is disclosed. In various embodiments, a locality measure is computed with respect to a group of segments comprising a portion of a file. The computed locality measure is compared to an at least partly dynamically determined fragmentation repair criteria, and a repair decision is made based at least in part on the comparison.