The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 2015

Filed:

May. 25, 2013
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Robyn L. Focazio, Round Rock, TX (US);

Yefim H. Michlin, Haifa, IL;

Larisa Shwartz, Scarsdale, NY (US);

Maheswaran Surendra, Croton-on-Hudson, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/26 (2006.01); G06F 17/18 (2006.01); G06F 11/36 (2006.01); G06Q 10/00 (2012.01);
U.S. Cl.
CPC ...
G06F 11/261 (2013.01); G06F 17/18 (2013.01); G06F 11/3672 (2013.01); G06Q 10/00 (2013.01);
Abstract

A method for comparing systems includes running, simultaneously, a first system and a second system, wherein the first system and the second system process events, collecting first data from the first system based on the processing of the events, collecting second data from the second system based on the processing of the events, wherein the second system includes at least one feature different than the first system, and performing a sequential probability ratio test based on the first data and the second data.


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