The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 2015

Filed:

Aug. 28, 2012
Applicants:

John Archie Mossman, La Mesa, CA (US);

Robert A. Mccarthy, Algonquin, IL (US);

Inventors:

John Archie Mossman, La Mesa, CA (US);

Robert A. McCarthy, Algonquin, IL (US);

Assignee:

Maxim Integrated Products, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/3187 (2006.01); G01R 1/00 (2006.01);
U.S. Cl.
CPC ...
G01R 1/00 (2013.01);
Abstract

An integrated circuit with analog device fault detection includes an integrated circuit die having an analog device, an on-line fault detector and a control circuit. The analog device has a power input, an analog device input and an analog device output and the on-line fault detector is coupled to at least one of the power input, the analog device input and the analog device output and has a fault detector output. The control circuit is coupled to the fault detector and responsive to the fault detector output. Detector self-test (DST) circuitry can be provided to test the on-line fault detector and one or more circuit breakers can be provided to protect the analog device and other devices attached to the analog device.


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