The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 2015
Filed:
Dec. 27, 2012
Samsung Electronics Co., Ltd., Suwon-si, KR;
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;
Abstract
A sample analysis apparatus is provided with a structure for stopping rotation of a disc at a precise position. The sample analysis apparatus includes a disc configured to rotate on a rotation shaft and having at least one detection zone, an optical sensing apparatus configured to detect a reaction result at the at least one detection zone, at least one position determining protrusion provided on an exterior surface of the disc, a slider movably disposed to in a radial direction relative to the disc, and a stopper mounted to the slider and configured to stop rotation of the disc by blocking the at least one position determining protrusion.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile