The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 2015
Filed:
Apr. 07, 2011
Gerhard Traxler, Vienna, AT;
Werner Palfinger, Vienna, AT;
Gerhard Traxler, Vienna, AT;
Werner Palfinger, Vienna, AT;
Institut Dr. Foerster GmbH & Co. KG, Reutlingen, DE;
Abstract
A thermographic test method locally resolves detection and identification of defects near the surface in a test object. A surface area of the test object is heated up. A series of thermographic images following one after another at a time interval is recorded within a heat propagation phase, each image representing a local temperature distribution in a surface region of the test object recorded by the image. Positionally correctly assigned temperature profiles are determined from the images, each positionally correctly assigned temperature profile being assigned to the same measuring region of the test object surface. Variations over time of temperature values are determined from the temperature profiles for a large number of measuring positions of the measuring region. These variations are evaluated on the basis of at least one evaluation criterion indicative of the heat flow in the measuring region.