The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 2015
Filed:
Feb. 27, 2012
Hirohiko Obinata, Tokyo, JP;
Kumiko Horikoshi, Tokyo, JP;
Hirohiko Obinata, Tokyo, JP;
Kumiko Horikoshi, Tokyo, JP;
YOKOGAWA ELECTRIC CORPORATION, Tokyo, JP;
Abstract
A radiation inspection apparatus may include a radiation source that irradiates linear radiation, which is parallel to an inspection direction set on an inspection target, to the inspection target, a line type detector that detects the radiation transmitted through the inspection target, a correction detector that is disposed in at least one of a position between the radiation source and the inspection target and a position between the inspection target and the line type detector, the correction detector moving along the inspection direction to detect the radiation, which has been irradiated from the radiation source, at each of a plurality of inspection positions along the inspection direction, and a correction device that corrects the detection result of the line type detector by using the detection result of the correction detector.