The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 2015
Filed:
Dec. 11, 2013
Ut-battelle, Llc, Oak Ridge, TN (US);
Justin S. Baba, Knoxville, TN (US);
UT-Battelle, LLC, Oak Ridge, TN (US);
Abstract
Refractometers for simultaneously measuring refractive index of a sample over a range or wavelengths of light include dispersive and focusing optical systems. An optical beam including the rang of wavelengths is spectrally spread along a first axis and focused along a second axis so as to be incident to an interface between the sample and a prism at a range of angles of incidence including a critical angle for at least one wavelength. In some cases, the prism can have a triangle, parallelogram, trapezoid, or other shape. In some cases, the optical beam can be reflected off of multiple interfaces between the prism and the sample. An imaging detector is situated to receive the spectrally spread and focused light from the interface and form an image corresponding to angle of incidence as a function of wavelength. One or more critical angles are indentified and corresponding refractive indices are determined.