The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 2015

Filed:

Jan. 23, 2013
Applicant:

The Boeing Company, Chicago, IL (US);

Inventors:

Simon D. Senibi, Covington, WA (US);

Jeffrey M. Hansen, Renton, WA (US);

Assignee:

The Boeing Company, Chicago, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G01M 99/00 (2011.01); G01M 17/00 (2006.01); G06F 17/00 (2006.01);
U.S. Cl.
CPC ...
G01M 99/00 (2013.01); G01M 17/00 (2013.01); G06F 17/00 (2013.01);
Abstract

A system and method for environmental testing and evaluation of non-destructive inspection (NDI) sensors is provided. The system has a structure having a plurality of NDI sensors to be tested. The system further has an environmental chamber containing heating elements and cooling elements for heating and cooling the NDI sensors when the structure is secured to the environmental chamber. The system further has an impact testing assembly positioned over the structure for impacting the structure. The system further has a data acquisition computer subsystem coupled to the environmental chamber and coupled to the NDI sensors. The data acquisition computer subsystem controls and monitors the heating and cooling elements, and collects and processes temperature and impact data acquired by the NDI sensors.


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