The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 2015

Filed:

Nov. 19, 2013
Applicants:

Kensuke Masuda, Kanagawa, JP;

Go Maruyama, Kanagawa, JP;

Yuji Yamanaka, Kanagawa, JP;

Inventors:

Kensuke Masuda, Kanagawa, JP;

Go Maruyama, Kanagawa, JP;

Yuji Yamanaka, Kanagawa, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/46 (2006.01); G01J 3/51 (2006.01);
U.S. Cl.
CPC ...
G01J 3/513 (2013.01); G01J 3/462 (2013.01); G01J 3/51 (2013.01); G01J 2003/467 (2013.01);
Abstract

An apparatus or system of estimating a spectrum of an object includes a plurality of filters or a plurality of filter areas that respectively have spectral characteristics different from one another, wherein at least two filters or filter areas have transmittance greater than a predetermined value throughout a wavelength range subject for estimation. The image capturing apparatus or system estimates a line spectrum of an object using spectral images of the at least two filters or filter areas having transmittance greater than the predetermined value.


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