The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 2015
Filed:
Sep. 03, 2014
Videk, Inc., Fairport, NY (US);
James Richard Reda, Jericho, VT (US);
Brandon Michael Sterner, Penfield, NY (US);
Christine Panarites Thomas, Macedon, NY (US);
Thomas Frederik Slechta, Pittsford, NY (US);
Videk, Inc., Fairport, NY (US);
Abstract
A system that measures deviation of printed color at selected locations on a moving substrate from a target color. The system comprises using a printed test image of target color, a calibrated spectrophotometer to provide spectral response values of the target color on the test image, a photonic device that provides tri-stimulus values from inline printed images and a computing device. The computing device compares the tri-stimulus values to spectral response values for the test image to calculate a spectral transformation matrix at each location selected to remove variations in optical and mechanical parameters. The spectral transformation matrix is applied to future mapped sets of tri-stimulus values of printed colors captured by the photonic device from selected locations to determine in real-time the deviation of color and thereby control color quality.