The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 2015

Filed:

Nov. 23, 2011
Applicants:

Christopher David Young, Excelsior, MN (US);

Daniel Paul Carlson, Coon Rapids, MN (US);

Lucas Paul Keranen, Hutchinson, MN (US);

Jeffrey P. Schirer, Minnetonka, MN (US);

Inventors:

Christopher David Young, Excelsior, MN (US);

Daniel Paul Carlson, Coon Rapids, MN (US);

Lucas Paul Keranen, Hutchinson, MN (US);

Jeffrey P. Schirer, Minnetonka, MN (US);

Assignee:

Hysitron, Inc., Eden Prairie, MN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D 18/00 (2006.01); B82Y 35/00 (2011.01); G01B 5/28 (2006.01); G01B 21/04 (2006.01); G01N 1/42 (2006.01); G01Q 60/36 (2010.01); G01Q 40/00 (2010.01); G01Q 30/04 (2010.01);
U.S. Cl.
CPC ...
G01D 18/008 (2013.01); B82Y 35/00 (2013.01); G01B 5/28 (2013.01); G01B 21/042 (2013.01); G01N 1/42 (2013.01); G01Q 30/04 (2013.01); G01Q 40/00 (2013.01); G01Q 60/366 (2013.01); G01N 2203/021 (2013.01); G01N 2203/0206 (2013.01);
Abstract

A method of calibrating a mechanical instrument assembly includes reading a memory device coupled with a mechanical testing instrument, the mechanical testing instrument having one or more mechanical characteristics with values unique to the mechanical testing instrument, and reading includes reading of one or more calibration values based on the one or more mechanical characteristic values. The method further includes calibrating the mechanical instrument assembly according to the one or more calibration values. The mechanical testing instrument is coupled with the mechanical instrument assembly.


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