The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 2015
Filed:
Oct. 02, 2012
Commissariat À L'energie Atomique ET Aux Energies Alternatives, Paris, FR;
Dmitry Melyukov, Paris, FR;
Pierre-Yves Thro, Paris, FR;
Abstract
The invention relates to a method for measuring a ray rof a radiation beam (), characterized in that it comprises the steps according to which a source () of a radiation beam () excites (S) a standard member () via heat, in a periodic manner at a frequency (f), thereby obtaining a periodic thermal excitation of the standard member (); a sensor () measures (S) a periodic thermal response on the part of the standard member, in response to the periodic thermal excitation; a processor () determines (S) a phase shift (φ) between the periodic thermal excitation and the periodic thermal response; the source () exciting the standard member for a plurality of frequencies (f) and the processor () determining a phase shift for each frequency (f), and thereby determining a plurality of phase shifts (φ); the processor () determines (S) a minimum φ min of the phase shift (φ) thanks to the plurality of phase shifts determined in this manner, and determines (S) the ray rof the beam () via the following formula: r/g(φ) where Δ is the thickness of the standard member () and where g is a function dependent on the type of heat radiation beam ().