The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 2015
Filed:
Nov. 30, 2009
Applicants:
Robert H. Schiestl, Encino, CA (US);
Nikos Hontzeas, Los Angeles, CA (US);
Jiri Aubrecht, Stonington, CT (US);
Yelena O. Rivina, Sherman Oaks, CA (US);
Inventors:
Robert H. Schiestl, Encino, CA (US);
Nikos Hontzeas, Los Angeles, CA (US);
Kurt M. Hafer, Los Angeles, CA (US);
Jiri Aubrecht, Stonington, CT (US);
Yelena O. Rivina, Sherman Oaks, CA (US);
Assignee:
The Regents of the University of California, Oakland, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/02 (2006.01); G01N 33/50 (2006.01);
U.S. Cl.
CPC ...
C12Q 1/025 (2013.01); G01N 33/5014 (2013.01); G01N 33/5017 (2013.01); G01N 33/5076 (2013.01); G01N 33/5079 (2013.01);
Abstract
The disclosure provides methods, systems, and kits for assaying an agent for mutagenic properties. The methods systems and kits utilize a DEL selectable marker and a colorimetric detection systems. Also included are methods systems and kits that utilize a DEL selectable marker and a regent that detects mitochondrial activity.