The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 2015

Filed:

Jan. 23, 2012
Applicants:

Satoshi Matsunaga, Nasushiobara, JP;

Masatoshi Nishino, Otawara, JP;

Jiro Higuchi, Otawara, JP;

Osamu Nakajima, Otawara, JP;

Yoshihiro Oomori, Otawara, JP;

Tomokazu Fujii, Nasushiobara, JP;

Inventors:

Satoshi Matsunaga, Nasushiobara, JP;

Masatoshi Nishino, Otawara, JP;

Jiro Higuchi, Otawara, JP;

Osamu Nakajima, Otawara, JP;

Yoshihiro Oomori, Otawara, JP;

Tomokazu Fujii, Nasushiobara, JP;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 8/00 (2006.01); A61B 8/06 (2006.01); A61B 8/08 (2006.01);
U.S. Cl.
CPC ...
A61B 8/465 (2013.01); A61B 8/06 (2013.01); A61B 8/463 (2013.01); A61B 8/469 (2013.01); A61B 8/488 (2013.01); A61B 8/54 (2013.01); A61B 8/56 (2013.01);
Abstract

The ultrasound diagnosis apparatus according to the embodiment includes an ultrasound probe that transmits and receives ultrasound waves to and from a subject, and generates and displays images of the inside of the subject based on the reception results from the ultrasound probe. The ultrasound diagnosis apparatus includes a memory, a detector, a selection part, and a processor. The memory stores association information that associates positions in real space with examination conditions including image quality conditions and/or application type. The detector detects the position of the ultrasound probe in real space. The selection part selects examination conditions corresponding to the detected position based on the association information. The processor performs processing based on the selected examination conditions.


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