The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 2015

Filed:

Feb. 12, 2013
Applicant:

Siemens Aktiengesellschaft, Munich, DE;

Inventors:

Steffen Kappler, Effeltrich, DE;

Martin Petersilka, Adelsdorf, DE;

Karl Stierstorfer, Erlangen, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/03 (2006.01); A61B 6/00 (2006.01); G01T 1/29 (2006.01);
U.S. Cl.
CPC ...
A61B 6/032 (2013.01); A61B 6/4233 (2013.01); A61B 6/542 (2013.01); G01T 1/2985 (2013.01);
Abstract

A method is disclosed for operating a computed tomography device including an x-ray source embodied to emit a fan-type beam bundle and a detector arrangement interacting therewith and including a plurality of detector elements. An embodiment of the method provides that an integration time provided to read out a detector element is dependent on the position of the detector element within the detector arrangement, wherein with a detector element which detects x-rays which penetrate the isocenter lying between the x-ray source and the detector arrangement, a longer integration time is provided, than with a detector element which detects x-rays which penetrate an examination volume which is further away from the isocenter.


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