The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2015
Filed:
Jan. 17, 2014
Atmel Corporation, San Jose, CA (US);
Katelijn Vleugels, San Carlos, CA (US);
Barry Thompson, San Jose, CA (US);
Atmel Corporation, San Jose, CA (US);
Abstract
Dynamic adjustment of offset between timebases of separated electronic circuits is provided based on an amount of time between synchronization events, wherein a synchronization event is an event involving communication across a separation between the separated electronic circuits in order to synchronize the timebases. The dynamic adjustment can be dynamically or adaptively adjusting a margin of error to account for drift that may have occurred since a prior synchronization event. Adjustments might be done by applying a learning sequence to quantify and adjust for static or slowly varying delays between the timebases and coordinating the timebases using output of the learning sequence.