The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2015
Filed:
Jul. 12, 2013
Qualcomm Incorporated, San Diego, CA (US);
Ralph Akram Gholmieh, San Diego, CA (US);
Daniel Amerga, San Diego, CA (US);
Sivaramakrishna Veerepalli, San Diego, CA (US);
Ketan Narendra Patel, Santa Clara, CA (US);
Jack Shyh-Hurng Shauh, San Diego, CA (US);
Kuo-Chun Lee, San Diego, CA (US);
Ankur Verma, San Diego, CA (US);
Gordon Kent Walker, San Diego, CA (US);
Nagaraju Naik, San Diego, CA (US);
Shailesh Maheshwari, San Diego, CA (US);
QUALCOMM INCORPORATED, San Diego, CA (US);
Abstract
Certain aspects of the present disclosure relate to methods and apparatus for reporting signal quality in overlapping Multimedia Broadcast Single Frequency Networks (MBSFN) areas. A UE may determine a signal quality estimate for each of two or more overlapping MBSFN areas based on Signal to Noise Ratio (SNR) information and Modulation and Coding Scheme (MCS) information for the MBSFN area. The UE may then determine a combined signal quality based on the signal quality estimates of the MBSFN areas.