The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2015

Filed:

Jan. 29, 2013
Applicants:

Steve Iseberg, Hoffman Estates, IL (US);

Steve Viranyi, Palatine, IL (US);

Andrew Dale, Mount Prospect, IL (US);

Jerrold S. Zdenek, Deer Park, IL (US);

Inventors:

Steve Iseberg, Hoffman Estates, IL (US);

Steve Viranyi, Palatine, IL (US);

Andrew Dale, Mount Prospect, IL (US);

Jerrold S. Zdenek, Deer Park, IL (US);

Assignee:

ETYMOTIC RESEARCH, INC., Elk Grove Village, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); H04R 29/00 (2006.01); A61B 5/12 (2006.01);
U.S. Cl.
CPC ...
H04R 29/00 (2013.01); A61B 5/121 (2013.01); A61B 5/7203 (2013.01); A61B 2560/0252 (2013.01); A61B 2560/0257 (2013.01);
Abstract

Certain embodiments provide a hearing testing system. The hearing testing system includes a transducer and an environmental sensor coupled with an acoustic channel. The environmental sensor is configured to measure environmental conditions of the acoustic channel. The hearing testing system includes a processor. The processor is configured to receive the environmental conditions from the environmental sensor. The processor is configured to apply, based on the measure environmental conditions, correction data to a transducer response to generate a corrected transducer response. In certain embodiments, the processor is configured to control a heating element based on a measured temperature to maintain a pre-defined temperature, or range of temperatures, at a testing probe.


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