The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2015
Filed:
Oct. 26, 2012
Applicant:
Raytheon Company, Waltham, MA (US);
Inventors:
Richard J. Wright, Tucson, AZ (US);
William R. Owens, Tucson, AZ (US);
Gregory E. Longerich, Oro Valley, AZ (US);
Andrew F. Varecka, Tucson, AZ (US);
Perry H. Frahm, Tucson, AZ (US);
David C. Robillard, Tucson, AZ (US);
Emerald J. Adair, Vail, AZ (US);
Assignee:
RAYTHEON COMPANY, Waltham, MA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/232 (2006.01); H04N 5/33 (2006.01);
U.S. Cl.
CPC ...
H04N 5/332 (2013.01); H04N 5/23232 (2013.01);
Abstract
An optical imaging system and method in which a second channel is used to provide alignment data for achieving image frame stacking of image data in a first channel. In one example, image stacking of infrared images is achieved by obtaining and analyzing corresponding visible images to provide alignment data that is then used to align and stack the infrared images.