The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2015
Filed:
Nov. 07, 2014
Mstar Semiconductor, Inc., Hsinchu Hsien, TW;
Chih-Cheng Kuo, Hsinchu County, TW;
Wen-Chieh Yang, Hsinchu County, TW;
Chu-Hsin Chang, Hsinchu County, TW;
Tai-Lai Tung, Hsinchu County, TW;
MSTAR SEMICONDUCTOR, INC., Hsinchu Hsien, TW;
Abstract
A method for calculating an error of a sampling clock is provided. The sampling clock is used for sampling a signal to generate a first sample data group and a second sample data group. Each of the first and second sample data groups includes a header having a predetermined sequence. The method includes: performing a correlation operation on the first and second sample data groups with data of the predetermined format to obtain first and second correlation results, respectively; comparing the first and second correlation results to generate a sample data group offset; and generating the error of the sampling clock according to the sample data group offset and a time difference between the first and second sample data groups.