The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2015
Filed:
Jan. 15, 2014
Applicant:
Mitsubishi Electric Research Laboratories, Inc., Cambridge, MA (US);
Inventors:
Philip Orlik, Cambridge, MA (US);
Zhiyuan Weng, Stony Brook, NY (US);
Kyeongjin Kim, Lexington, MA (US);
Assignee:
Mitsubishi Electric Research Laboratories, Inc., Cambridge, MA (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2015.01); H04B 1/10 (2006.01);
U.S. Cl.
CPC ...
H04B 1/1027 (2013.01);
Abstract
A method detects narrow band interference in wireless networks by first thresholding each block of samples to produce thresholded samples. The samples are normalized frequency magnitudes obtained from a spectrum of a wireless signal in a channel. Each block of the thresholded samples is summed to produce a thresholded value for each block. Then, thresholded values are autocorrelated to determine whether a bandwidth of the wireless signal is consistent with narrow band interference.