The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2015

Filed:

Oct. 16, 2013
Applicant:

Infineon Technologies Austria Ag, Villach, AT;

Inventor:

Bernhard Knuepfer, Otterfing, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 23/48 (2006.01); H01L 23/52 (2006.01); H01L 29/40 (2006.01); H01L 23/498 (2006.01); H01L 21/78 (2006.01); H01L 23/02 (2006.01); H01L 23/495 (2006.01); H01L 23/00 (2006.01); H01L 23/31 (2006.01);
U.S. Cl.
CPC ...
H01L 23/564 (2013.01); H01L 23/3157 (2013.01); H01L 23/48 (2013.01); H01L 24/05 (2013.01); H01L 23/3121 (2013.01); H01L 2924/13091 (2013.01);
Abstract

A die according to an embodiment includes a contact pad configured to provide an electrical contact to a circuit element included in the die, a lateral edge closest to the contact pad and a cover layer including a protective structure, the protective structure including at least one elongated structure, wherein the cover layer includes an opening providing access to the contact pad to couple the contact pad electrically to an external contact, wherein the protective structure is arranged between the lateral edge and the contact pad. Using an embodiment may reduce a danger of contamination of a top side of a die during fabrication and packaging a chip.


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