The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2015

Filed:

Jan. 20, 2014
Applicant:

Seagate Technology Llc, Cupertino, CA (US);

Inventors:

Shoutao Wang, Fremont, CA (US);

Weilu Xu, San Jose, CA (US);

Chung-hee Chang, Fremont, CA (US);

Xiaoguang Ma, Fremont, CA (US);

Mark Johnson, San Ramon, CA (US);

Abebe Hailu, San Jose, CA (US);

Charles Chen, Fremont, CA (US);

Assignee:

Seagate Technology LLC, Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 5/66 (2006.01); G11B 5/84 (2006.01); G11B 5/73 (2006.01); G11B 5/738 (2006.01);
U.S. Cl.
CPC ...
G11B 5/84 (2013.01); G11B 5/732 (2013.01); G11B 5/738 (2013.01); G11B 5/7325 (2013.01);
Abstract

An apparatus and method are provided for improving perpendicular magnetic recording media. The present invention provides media, and a method of fabricating media in a cost-effective manner, with a reduced ruthenium (Ru) content interlayer structure, while meeting media performance requirements. A perpendicular magnetic recording medium is provided comprising a non-magnetic substrate having a surface, and a layer stack situated on the substrate surface. The layer stack comprises, in overlying sequence from the substrate surface a magnetically soft underlayer; an amorphous or crystalline, non-magnetic seed layer; an interlayer structure for crystallographically orienting a layer of a perpendicular magnetic recording material situated on the underlayer; and at least one crystallographically oriented, magnetically hard, perpendicular magnetic recording layer situated on the interlayer structure. The interlayer structure is a stacked structure comprising, in overlying sequence: a chromium alloy situated on the seed layer; and an upper interlayer situated on the chromium alloy.


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