The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2015

Filed:

Feb. 05, 2014
Applicant:

Honeywell International Inc., Morristown, NJ (US);

Inventor:

Markku Kellomäki, Kuopio, FI;

Assignee:

Honeywell International Inc., Morristown, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/40 (2006.01); G06K 9/52 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/40 (2013.01); G06K 9/52 (2013.01); G06T 7/0004 (2013.01); G06T 2207/30108 (2013.01); G06T 2207/30124 (2013.01);
Abstract

A method includes, using at least one processing device, obtaining an image of a surface having a texture and identifying a dominant size of the texture using a discrete auto-covariance function of the image. A first positive local maximum of the discrete auto-covariance function could be identified. The discrete auto-covariance function could include points associated with positive numbers of whole pixels, and the first positive local maximum of the discrete auto-covariance function could be identified at one of the points. Sub-pixel estimation could also be performed using the point associated with the first positive local maximum and one or more neighboring points. Performing the sub-pixel estimation could include fitting a polynomial curve to the point associated with the first positive local maximum and the one or more neighboring points and identifying a number of whole and fractional pixels associated with a maximum of the polynomial curve.


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