The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2015
Filed:
Mar. 14, 2014
Yoshinori Sochi, Nerima-ku, JP;
Yoshinori Sochi, Nerima-ku, JP;
RICOH COMPANY, LTD., Tokyo, JP;
Abstract
An image inspection apparatus for inspecting an image output on a recording medium by scanning the recording medium as a scanned image. The inspection apparatus having a display controller that controls display of a normal read image, which includes only permissible defects for each type of defect, in the normal image display area, and that controls display of an abnormal read image, which includes at least one impermissible defect for each type of defect, in the abnormal image area. The inspection apparatus also includes a defect permissible changing unit that receives a moving operation instruction, which moves the displayed image between the normal image display area and the abnormal image display area and that, in response to receiving the moving operation instruction, changes the permissible defect level of at least one type of defect.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile