The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2015

Filed:

Oct. 28, 2013
Applicant:

Eastman Kodak Company, Rochester, NY (US);

Inventors:

Ronald J. Duke, Centerville, OH (US);

James Alan Katerberg, Kettering, OH (US);

Assignee:

EASTMAN KODAK COMPANY, Rochester, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 29/393 (2006.01); B41J 13/26 (2006.01); G06K 15/02 (2006.01); G06K 15/10 (2006.01);
U.S. Cl.
CPC ...
G06K 15/027 (2013.01); B41J 29/393 (2013.01); G06K 15/102 (2013.01);
Abstract

A method for aligning plurality of imaging systems for capturing images of a receiver medium. An illumination system is used to illuminate the receiver medium with an illumination pattern. First and second imaging systems are used to capture images of the receiver medium, each including at least a portion of the illumination pattern. The first and second images are analyzed to determine a relative position of the illumination pattern in the first and second images. Imaging system alignment parameters for use in aligning images captured with the first and second imaging systems are determined responsive to the determined relative position.


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