The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2015

Filed:

Sep. 26, 2013
Applicant:

Omron Corporation, Kyoto, JP;

Inventors:

Norikazu Tonogai, Nara, JP;

Tadashi Hyuga, Osaka, JP;

Yoshihisa Minato, Kyoto, JP;

Masamichi Oe, Kyoto, JP;

Masashi Kurita, Nara, JP;

Assignee:

OMRON Corporation, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/34 (2006.01); G06K 9/46 (2006.01); G06K 9/18 (2006.01); G06K 9/72 (2006.01);
U.S. Cl.
CPC ...
G06K 9/18 (2013.01); G06K 9/723 (2013.01); G06K 2209/01 (2013.01);
Abstract

An image processing method for identifying a region in an input image by character recognition, the region coinciding with a predetermined search condition, includes receiving the search condition, the search condition including assignments of plural format character strings, each format character string including an assignment of a character type or a specific character for each character of a recognition target, extracting a character string region becoming a candidate from the input image, calculating a similarity between a character recognition result and the plural format character strings with respect to each group of plural character string regions, the character recognition result being of each character string region included in each group, and determining the group coinciding with the search condition among the groups of plural character string regions according to the calculated similarity.


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