The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2015

Filed:

Jan. 13, 2014
Applicant:

Yeejang James Lin, San Jose, CA (US);

Inventor:

Yeejang James Lin, San Jose, CA (US);

Assignee:

Datiphy Inc., San Jose, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/16 (2006.01); G06F 21/60 (2013.01); G06F 21/57 (2013.01); H04L 29/06 (2006.01); H04L 29/08 (2006.01);
U.S. Cl.
CPC ...
G06F 21/60 (2013.01); G06F 21/577 (2013.01); H04L 63/102 (2013.01); H04L 63/1416 (2013.01); H04L 67/22 (2013.01); H04L 67/26 (2013.01);
Abstract

The present invention provides a system and method for evaluating risk associated with information access requests. The information access requests are collected, assigned a risk level according to user defined policies, a total risk is calculated and presented to user. The user can select a high risk event for further analysis. The system will break down the event into basic elements, so the user can ascertain the risk. The system allows a user to customize a report and the customized report can be saved as a template for future use.


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