The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2015
Filed:
Mar. 27, 2012
Hongping Dai, Chapel Hill, NC (US);
Corey Donald Dehaven, Raleigh, NC (US);
Hongping Dai, Chapel Hill, NC (US);
Corey Donald DeHaven, Raleigh, NC (US);
METABOLON INC., Research Triangle Park, NC (US);
Abstract
A method, apparatus, and computer-readable storage medium are provided for analyzing data from a component separation/mass spectrometer (CS-MS), wherein an intensity peak is determined, with an area thereof determined using an integration procedure, in each two-dimensional data set. The intensity peak indicates a sample component, and the area thereof indicates a relative quantity of the sample component. An integration procedure determines the area of selected peaks of a first portion of the two-dimensional data sets associated with a first sample component, and is applied to the intensity peaks of a second portion having the areas thereof not determined by that integration procedure, to adjust the relative quantity of the first sample component in the second portion samples relative to the relative quantity of the first sample component in the first portion samples. The re-integration may also involve determining whether a second sample component is indicated by the intensity peak.