The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2015

Filed:

Sep. 14, 2012
Applicants:

Eric W. Brown, New Fairfield, CT (US);

Jennifer Chu-carroll, Dobbs Ferry, NY (US);

James J. Fan, Hawthorne, NY (US);

David A. Ferrucci, Yorktown Heights, NY (US);

David C. Gondek, Astoria, NY (US);

Anthony T. Levas, Yorktown Heights, NY (US);

James W. Murdock, Iv, Millwood, NY (US);

Inventors:

Eric W. Brown, New Fairfield, CT (US);

Jennifer Chu-Carroll, Dobbs Ferry, NY (US);

James J. Fan, Hawthorne, NY (US);

David A. Ferrucci, Yorktown Heights, NY (US);

David C. Gondek, Astoria, NY (US);

Anthony T. Levas, Yorktown Heights, NY (US);

James W. Murdock, IV, Millwood, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30707 (2013.01); G06F 17/30651 (2013.01); G06F 17/30696 (2013.01); G06F 17/30713 (2013.01);
Abstract

Evidence profiling, in one aspect, may receive a candidate answer and supporting pieces of evidence. An evidence profile may be generated, the evidence profile communicating a degree to which the evidence supports the candidate answer as being correct. The evidence profile may provide dimensions of evidence, and each dimension may support or refute the candidate answer as being correct.


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