The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2015

Filed:

Oct. 19, 2012
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Scott D. Lashley, Portland, OR (US);

Bingjie Miao, Englewood, CO (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30442 (2013.01); G06F 17/30 (2013.01);
Abstract

An approach is provided in which a sample point system allocates sample point identifiers to a root node included an index tree that includes multiple leaf nodes. The sample point system distributes the sample point identifiers to the root node's child nodes, and recursively traverses through the index tree's hierarchical index levels and distributes the sample point identifiers from the child nodes to a subset of the index tree's leaf nodes. In turn, the sample point system collects sample data from the subset of the plurality of leaf nodes corresponding to the distributed sample point identifiers.


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