The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2015

Filed:

Oct. 08, 2013
Applicant:

Advanced Micro Devices, Inc., Sunnyvale, CA (US);

Inventors:

John Kalamatianos, Arlington, MA (US);

Johnsy Kanjirapallil John, Acton, MA (US);

Robert Gelinas, Needham, MA (US);

Vilas K. Sridharan, Brookline, MA (US);

Phillip E. Nevius, Arlington, MA (US);

Assignee:

Advanced Micro Devices, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/10 (2006.01); G11C 29/52 (2006.01); G11C 29/42 (2006.01); G11C 11/41 (2006.01); G11C 29/04 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1008 (2013.01); G11C 29/42 (2013.01); G11C 29/52 (2013.01); G11C 11/41 (2013.01); G11C 2029/0409 (2013.01);
Abstract

Hard errors in the memory array can be detected and corrected in real-time using reusable entries in an error status buffer. Data may be rewritten to a portion of a memory array and a register in response to a first error in data read from the portion of the memory array. The rewritten data may then be written from the register to an entry of an error status buffer in response to the rewritten data read from the register differing from the rewritten data read from the portion of the memory array.


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