The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2015

Filed:

Feb. 24, 2014
Applicant:

Oracle International Corporation, Redwood Shores, CA (US);

Inventors:

Lian Li, Carindale, AU;

Cristina N. Cifuentes, Brisbane, AU;

Assignee:

Oracle International Corporation, Redwood Shores, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0784 (2013.01);
Abstract

A method for performing path-sensitive data-flow analysis for use in error checking functions includes identifying at least a first instruction and a second instruction in a control flow graph of a function. The identified first instruction and second instruction are connected by at least a first control flow path and a second control flow path. The method further includes defining a path condition between the first instruction and the second instruction as a complex disjunction including a first conjunction of predicates for the first control flow path and a second conjunction of predicates for the second control flow path. The method further includes converting the path condition into conjunctive normal form to obtain a converted path condition that includes a disjunction of atomic constraints, generating a simplified path condition by simplifying the disjunction of atomic constraints in the converted path condition to a value, analyzing the function using the simplified path condition to detect an error, and presenting the error.


Find Patent Forward Citations

Li, Lian. (2015). Path-sensitive analysis framework for bug checking (U.S. Patent No. 9189318). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9189318

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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