The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2015

Filed:

Sep. 25, 2013
Applicant:

Emc Corporation, Hopkinton, MA (US);

Inventors:

Ao Ma, Palo Alto, CA (US);

Windsor W. Hsu, San Jose, CA (US);

Assignee:

EMC Corporation, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/34 (2006.01); G06F 11/20 (2006.01); G06F 11/22 (2006.01);
U.S. Cl.
CPC ...
G06F 11/008 (2013.01); G06F 11/2094 (2013.01); G06F 11/2221 (2013.01); G06F 11/3485 (2013.01);
Abstract

Techniques for predicting single-disk failures are described herein. According to one embodiment, first values of a predetermined diagnostic parameter collected from a set of known working disks and a set of known failed disks of a storage system are received. An optimal threshold of the received first values of the predetermined diagnostic parameter is determined based on a quantile distribution of the first values against a plurality of threshold candidates. A potential risk of disk failures of one or more disks of a target storage system is determined based on second values of the predetermined diagnostic parameter collected from the one or more disks of the target storage system in view of the optimal threshold.


Find Patent Forward Citations

Ma, Ao. (2015). System and method for predicting single-disk failures (U.S. Patent No. 9189309). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9189309

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