The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2015
Filed:
Oct. 03, 2011
Carl Von Platen, Malmö, SE;
Johan Eker, Lund, SE;
Carl Von Platen, Malmö, SE;
Johan Eker, Lund, SE;
TELEFONAKTIEBOLAGET L M ERICSSON (PUBL), Stockholm, SE;
Abstract
A method of statically testing dependence in a dataflow program is provided, the method comprising receiving a dataflow program which provides parameters, including consumption rates, production rates on connections between actors in the program and a number of initial samples (delays) on the connections, generating from the parameters a model of a precedence graph for the dataflow program representing dependence constraints between distinct firings of the number of actors. For the model, determining a feedback distance between multiple firings of a same actor, determining sets of parallel regions comprising a given number of actor firings of a same actor, composing mutually independent component regions comprising at least a part of the sets of parallel regions, and composing one or more composite regions comprising one or more component regions and/or one or more sets of parallel regions, being composed so that a pre-determined criteria is satisfied.