The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2015
Filed:
Aug. 26, 2014
National Instruments Corporation, Austin, TX (US);
Taylor L. Riche, Austin, TX (US);
Newton G. Petersen, Emporia, KS (US);
Hojin Kee, Austin, TX (US);
Adam T. Arnesen, Pflugerville, TX (US);
Haoran Yi, Austin, TX (US);
Dustyn K. Blasig, Pflugerville, TX (US);
Tai A. Ly, Austin, TX (US);
National Instruments Corporation, Austin, TX (US);
Abstract
System and method for convergence analysis. One or more state variables of a first program may be determined based on dependencies of variables in a first program. A second program corresponding to the first program is created based on the state variables and their dependencies, and executed multiple times. Each execution may include recording values of the state variables, determining an execution count, comparing the values to corresponding values from previous executions of the second program, and terminating the executing in response to the values matching corresponding values from at least one previous execution of the second program. A convergence property for the first program is determined based on the execution count, and indicating a number of executions of the first program required to generate all possible values of the one or more variables. The convergence property is stored, and may be useable to optimize the first program.