The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2015
Filed:
Dec. 24, 2008
Curtis E. Hrischuk, Holly Springs, NC (US);
Edward Emil Huth, Royal Palm Beach, FL (US);
Dazhi Wang, Durham, NC (US);
LI Zhang, Yorktown Heighs, NY (US);
Curtis E. Hrischuk, Holly Springs, NC (US);
Edward Emil Huth, Royal Palm Beach, FL (US);
Dazhi Wang, Durham, NC (US);
Li Zhang, Yorktown Heighs, NY (US);
GLOBALFOUNDRIES INC., Grand Cayman, KY;
Abstract
A method of determining accuracy of predicted system behavior can include creating a plurality of noise adjusted analytical models, wherein each noise adjusted analytical model is associated with a set of predefined analytical model parameters. A set of inferred analytical model parameters for each noise adjusted analytical model can be derived. Each set of inferred analytical model parameters can depend upon a current noise adjusted analytical model and each prior noise adjusted analytical model. For each set of inferred analytical model parameters, a measure of error between the set of inferred analytical model parameters and the set of predefined analytical model parameters associated with the noise adjusted analytical model from which the set of inferred analytical model parameters was derived can be determined.