The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2015
Filed:
Oct. 17, 2012
Raytheon Company, Waltham, MA (US);
Donald P. Bruyere, Tucson, AZ (US);
Jeffrey Wadsworth, Tucson, AZ (US);
William L. Chapman, Oro Valley, AZ (US);
RAYTHEON COMPANY, Waltham, MA (US);
Abstract
An interferometric inverse synthetic aperture radar (IFISAR) is described that can provide a height measurement of moving objects on a surface using a small radar aperture. The IFISAR includes a two-dimensional antenna array including a plurality of elements that are configured to receive a plurality of return signals carrying energy of a transmitted RF signal that are reflected from the target. A first antenna group and a second antenna group of the plurality of elements respectively located at opposite ends of the array are enabled, and a third antenna group of the plurality of elements located between the first antenna group and the second antenna group are disabled. A processor of the IFISAR is operatively coupled to the plurality of elements and configured to determine height characteristics of the target according to interferometric processing of the return signals received by the first antenna group and the second antenna group.