The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2015

Filed:

Mar. 07, 2012
Applicants:

Masao Yui, Otawara, JP;

Hiroshi Kusahara, Kyoto, JP;

Inventors:

Masao Yui, Otawara, JP;

Hiroshi Kusahara, Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/24 (2006.01); G01R 33/32 (2006.01); G01R 33/565 (2006.01); G01R 33/561 (2006.01);
U.S. Cl.
CPC ...
G01R 33/56518 (2013.01); G01R 33/5616 (2013.01);
Abstract

According to one embodiment, a magnetic resonance imaging apparatus includes a data acquisition unit, an eddy magnetic field measuring unit and an imaging unit. The data acquisition unit is configured to acquire magnetic resonance signals at mutually different timings with applying a gradient magnetic field for generating an eddy magnetic field. The eddy magnetic field measuring unit is configured to acquire eddy magnetic field information including a time constant of the eddy magnetic field based on phase information of the magnetic resonance signals acquired at the timings. The imaging unit is configured to perform imaging under an imaging condition or a data processing condition according to the eddy magnetic field information.


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