The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2015
Filed:
Dec. 21, 2012
Applicant:
SK Hynix Inc., Icheon-si Gyeonggi-do, KR;
Inventors:
Chul Kim, Icheon-si, KR;
Jong Chern Lee, Icheon-si, KR;
Assignee:
SK Hynix Inc., Gyeonggi-do, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01); G01R 31/26 (2014.01); G01R 31/28 (2006.01); G11C 29/02 (2006.01); G11C 29/12 (2006.01); G11C 29/48 (2006.01); G01R 31/3185 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2637 (2013.01); G01R 31/2853 (2013.01); G11C 29/022 (2013.01); G11C 29/025 (2013.01); G11C 29/1201 (2013.01); G11C 29/48 (2013.01); G01R 31/318513 (2013.01);
Abstract
A semiconductor apparatus includes a test voltage application unit, a first pad and a second pad. The test voltage application unit is configured to apply a test voltage to first and second TSVs in response to a test mode signal. The first pad is configured to output a first test signal outputted from the first TSV. And the second pad is configured to output a second test signal outputted from the second TSV.