The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2015

Filed:

Mar. 08, 2013
Applicants:

Inventec (Pudong) Technology Corporation, Shanghai, CN;

Inventec Corporation, Taipei, TW;

Inventor:

Yen-Hao Chen, Taipei, TW;

Assignees:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 23/16 (2006.01); G01R 13/02 (2006.01); G01R 31/317 (2006.01);
U.S. Cl.
CPC ...
G01R 13/0209 (2013.01); G01R 31/31726 (2013.01); G01R 31/31727 (2013.01);
Abstract

An analysis method for a signal time margin is provided. An input signal is received. The input signal is extracted to obtain a primary waveform, at least one first secondary waveform and at least one second secondary waveform of the input signal. The first secondary waveform and the second secondary waveform are respectively located before and after the primary waveform. Quantities of the first secondary waveform and the second secondary waveform are counted to respectively generate a first quantity and a second quantity. According to the first quantity, the primary waveform and the first secondary waveform, first bit combinations are generated, and according to the second quantity, the primary waveform and the second secondary waveform, second bit combinations are generated. The first and second bit combinations are integrated to generate third bit combinations. Signal analysis is performed on the third bit combinations to obtain a signal time margin.


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