The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2015

Filed:

May. 27, 2013
Applicant:

Weidmueller Interface Gmbh & Co. KG, Detmold, DE;

Inventors:

Grit Rother, Lemgo, DE;

Andreas Giese, Detmold, DE;

Herbert Ehlers, Blomberg, DE;

Lars Topp, Detmold, DE;

Lars Kuehne, Paderborn, DE;

Armin Herzog, Detmold, DE;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/06 (2006.01); G01R 1/04 (2006.01); G01R 1/067 (2006.01); G01R 19/155 (2006.01);
U.S. Cl.
CPC ...
G01R 1/04 (2013.01); G01R 1/06788 (2013.01); G01R 19/155 (2013.01);
Abstract

A measuring instrument, in particular a voltage tester, is provided having two probes which are arranged in separate housings through which connecting cables extend. The housings are magnetically attractive, because of either a first magnet arranged on a first one of the housings for cooperation with the magnetic material of the other housing, or a corresponding pair of opposed magnets provided in magnetically attractive relation on the two housings, respectively. Recesses are provided in the second housing opposite the corresponding magnets of the first housing. Corresponding pivot ribs extend circumferentially around the housings in the space between the first one magnet and the adjacent probe end, thereby to permit accurate spacing of the probes during the taking of a test measurement.


Find Patent Forward Citations

Loading…