The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2015

Filed:

Apr. 26, 2013
Applicant:

Shimadzu Corporation, Kyoto-shi, Kyoto, JP;

Inventor:

Takafumi Nakamura, Kyoto, JP;

Assignee:

Shimadzu Corporation, Kyoto-Shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 30/86 (2006.01);
U.S. Cl.
CPC ...
G01N 30/86 (2013.01); G01N 30/8641 (2013.01); G01N 30/8658 (2013.01); G01N 30/8665 (2013.01);
Abstract

A liquid chromatograph analyzing device, which without an analyst having to set complicated processing conditions before measuring a sample, is able to processes unaffected by fluctuations in room temperature and appearance of ghost peaks. In a liquid chromatograph analyzing device, an automatic sampler, a liquid sending pump, a column oven and a detection device are controlled by a calculation processing device. In addition to chromatograph creation unit, which creates chromatograms of a sample based on input detection signals, the calculation processing device has a correction parameter holding section and correction formula setting unit. The correction formula setting unit provides to the liquid chromatograph analyzing device a functionality for the analyst to set correction formulas for incorporating in the chromatograms created by the chromatograph creation unit changes to environmental conditions such as fluctuations in temperature around the liquid chromatograph analyzing device.


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