The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2015

Filed:

May. 31, 2012
Applicants:

Gary Glish, Chapel Hill, NC (US);

Mark Ridgeway, Billerica, MA (US);

Alice Pilo, West Lafayette, IN (US);

Inventors:

Gary Glish, Chapel Hill, NC (US);

Mark Ridgeway, Billerica, MA (US);

Alice Pilo, West Lafayette, IN (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); G01N 27/62 (2006.01);
U.S. Cl.
CPC ...
G01N 27/624 (2013.01);
Abstract

Improved methods and devices for analysis of gas phase ions via ion mobility type analyzers, particularly high field asymmetric waveform ion mobility analyzers (FAIMS), by linking gas composition and/or flow rate with the scanning of compensation voltage or asymmetric waveform amplitude are provided. Linking these parameters results in improvements in resolution, sensitivity, and selectivity. The methods and devices according to the presently disclosed subject matter provide for the improvement in resolution for specific ions without affecting the entire FAIMS spectrum.


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