The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2015
Filed:
Sep. 20, 2013
Morpho Detection, Inc., Newark, CA (US);
Geoffrey Harding, Hamburg, DE;
Helmut Rudolf Otto Strecker, Hamburg, DE;
MORPHO DETCTION, LLC, Newark, CA (US);
Abstract
An x-ray diffraction imaging (XDI) system having a system axis includes at least one x-ray source configured to generate x-rays directed toward an object that includes at least one substance. The at least one x-ray source is further configured to irradiate at least one voxel defined within the object with x-rays arriving from a plurality of directions, each direction defined by an angle of incidence with respect to the system axis. The system also includes at least one detector configured to detect scattered x-rays after the x-rays have passed through the object. The system further includes at least one processor coupled to the at least one detector. The processor is programmed to generate a plurality of XDI profiles of the object voxel. Each XDI profile is a function of an associated angle of incidence.