The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2015
Filed:
Apr. 17, 2012
Tao LI, Shanghai, CN;
Guiju Song, Shanghai, CN;
Kevin George Harding, Niskayuna, NY (US);
Dongmin Yang, Skaneateles, NY (US);
Zirong Zhai, Shanghai, CN;
Jie Han, Shanghai, CN;
Gil Abramovich, Niskayuna, NY (US);
Tao Li, Shanghai, CN;
Guiju Song, Shanghai, CN;
Kevin George Harding, Niskayuna, NY (US);
Dongmin Yang, Skaneateles, NY (US);
Zirong Zhai, Shanghai, CN;
Jie Han, Shanghai, CN;
Gil Abramovich, Niskayuna, NY (US);
GENERAL ELECTRIC COMPANY, Schenectady, NY (US);
Abstract
An optical system configured to visually inspect a target having a variable position with respect to the optical system is provided. The optical system includes a polarizer configured to convert an incident light reflected or diffused from the target into linearly polarized light; a light modulating element configured to modulate a polarization state of the linearly polarized light in response to control signals; and a lens group comprising at least one birefringent element, the birefringent element configured to refract or reflect the modulated linearly polarized light with a first polarization state under a first refraction index to enable inspection of the target at a first object position, and the birefringent element further configured to refract or reflect the modulated linearly polarized light with a second polarization state under a second refraction index to enable inspection of the target at a second object position.