The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2015
Filed:
May. 15, 2014
Fuji Xerox Co., Ltd., Tokyo, JP;
Hiroyuki Hotta, Kanagawa, JP;
FUJI XEROX CO., LTD., Tokyo, JP;
Abstract
An inspection apparatus includes a light emitting device, a first lens, a second lens, a light receiving device, and an inspection device. The light emitting device emits a light beam. The first lens is disposed such that an optical axis thereof extends in one direction and changes divergence of the light beam having been emitted from the light emitting device and passing therethrough. The second lens is disposed such that an optical axis of the second lens extends in the one direction. The light beam having exited the first lens and passing through the second lens is condensed on the inspection object by the second lens. The light receiving device is disposed between the first lens and the second lens and receives at least part of the reflected light beam. The inspection device detects a reflection characteristic in accordance with a result of light reception.