The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2015
Filed:
Feb. 21, 2013
New York University, New York, NY (US);
Hagay Shpaisman, Highland Park, NJ (US);
Bhaskar Jyoti Krishnatreya, Astoria, NY (US);
David G. Grier, New York, NY (US);
NEW YORK UNIVERSITY, New York, NY (US);
Abstract
An in-line holographic microscope is used for measurements of micrometer-scale particles and associated suspending fluid medium containing the particles. The system yields heterodyne scattering patterns that may be interpreted with Lorenz-Mie theory to obtain precise time-resolved information on the refractive index of the suspending medium for determining chemical composition, concentrations and makeup thereof. This approach can perform spatially resolved refractometry with measurements on calibrated refractive index standards and monitor chemical concentration in a microfluidic channel. Using commercially available colloidal spheres as probe particles and a standard video camera for detection yields volumetric refractive index measurements with a resolution of 2×10RIU for each probe particle in each holographic snapshot.