The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 2015

Filed:

Oct. 27, 2011
Applicant:

Yasuhiro Kurahashi, Aiko-gun, JP;

Inventor:

Yasuhiro Kurahashi, Aiko-gun, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 11/00 (2006.01); B23Q 17/24 (2006.01); G01B 11/24 (2006.01); G06F 3/041 (2006.01); G06F 3/0481 (2013.01);
U.S. Cl.
CPC ...
G01C 11/00 (2013.01); B23Q 17/2409 (2013.01); B23Q 17/2452 (2013.01); G01B 11/2433 (2013.01); G06F 3/041 (2013.01); G06F 3/0481 (2013.01);
Abstract

In the machine tool () pertaining to the present invention, the contour lines () of a tool () are displayed on a display screen (S). When an operator measuring the dimensions traces a contour line () on the display screen (S) of a touch panel () with a finger, it is possible to automatically identify, on the display screen (S), the site to be measured (i.e., the contour line ()) on the tool (). In this way, an operator can measure the dimensions of the tool () in an extremely simple manner. Additionally, it is possible to automatically measure the tool diameter or the blade position of the tool () as the operator designates a specific position on the contour line () of the tool (). Thus, with such a method for measuring the dimensions of the tool (), it is possible to easily identify an unexpected site to be measured on a tool having complex contour lines, such as a multi-stage tool.


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