The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 2015
Filed:
Oct. 31, 2012
Nikon Corporation, Chiyoda-ku, Tokyo, JP;
Tomoaki Yamada, Yokohama, JP;
NIKON CORPORATION, Tokyo, JP;
Abstract
A profile measuring apparatus includes: a light source device from which a projection light is irradiated, the projection light having a light amount changing with lapse of time in a first period and a predetermined spatial distribution; an imaging element; a second period setting section which sets a second period including at least a part of the first period; and a profile information obtaining section which obtains an information of the profile of the object based on an image data taken by the imaging element in the second period. The second period setting section sets the second period based on a light amount of a light which comes into the imaging element at the time of an imaging performed before one imaging performed in the second period; and a light amount change pattern of the projection light changing with lapse of time in the first period.